Welcome to the Satellogic Documentation Center
Unlock the power of satellite imagery with the Satellogic Developer Center. This is your gateway to integrating high-resolution Earth observation data into your workflows through robust APIs, clear documentation, and a wide array of resources. Whether you're building applications, automating tasking, or analyzing imagery, our platform enables a seamless experience from start to finish.
About Satellogic
At Satellogic, we are pioneers in Earth observation technology, leveraging a fleet of high-resolution satellites to capture and provide valuable insights about our planet. Our commitment to innovation and sustainability is reflected in our mission to democratize access to geospatial information for a wide range of industries, from agriculture and environmental monitoring to urban planning and disaster response.
About Aleph
Aleph is Satellogic’s unified platform for discovering, purchasing, and managing satellite imagery. Built for both GUI and API users, Aleph provides a seamless experience for exploring archives, tasking new image captures, and integrating insight layers—all in one place. With intuitive tools and powerful automation, Aleph empowers users to unlock the full value of satellite data efficiently and at scale.
What You’ll Find in This Documentation
Aleph API Documentation
Integrate satellite imagery directly into your systems. Our API docs include full reference materials, implementation guides, and example workflows to support developers and data engineers in building and scaling applications with satellite data.
Aleph GUI User Guide
Navigate Aleph’s graphical interface with ease. The GUI User Guide walks you through every part of the platform—from searching archives to placing tasking orders and managing downloads—designed for imagery analysts, access managers, and general users alike.
Data Specifications
Understand the structure and characteristics of the satellite imagery data available through Aleph. This section includes details on data formats, radiometric and geometric properties, processing levels, and sensor specifications—everything you need to effectively integrate and interpret the data.